Yield Explorer
Synopsys, Inc.
Nanometer node yield issues are dominated by design-process-test interactions, mandating cross-domain analyses to mitigate these issues rapidly. Yield Explorer brings yield relevant data from diverse sources such as physical design flow, wafer manufacturing, and wafer and chip level testing into a single data bank. A complement to the Synopsys TetraMAX diagnostics solution, Yield Explorer is a timely answer to the complex challenges faced by today’s product engineering teams. With the widest possible range of data at their disposal, users achieve unsurpassed clarity in root cause analysis when faced with systematic yield limiters. Correlating output from ATE test to wafer parametric data on one side, and DRC flags or timing distribution on the other, is now easily possible. Yet Yield Explorer achieves this with an order of magnitude advantage in analysis speed in the most complex of use cases - for example, 10X faster volume diagnostics analysis of ATPG output.
Industry
Red Hat Certifications
This product has been certified to run on the following Red Hat products and technologies:
| Target Product | Level |
|---|---|
| Red Hat Enterprise Linux 6.x | Self-Certified |
