The DesignWare® Self-Test and Repair (STAR) Memory System is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or non-repairable embedded memories across any foundry or process node. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System® is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced processes. The STAR Memory System's highly automated design implementation and diagnostic flow enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production. The newest version of the STAR Memory System is built on a new architecture and includes optimized test algorithms specifically targeted at increasing coverage for memory defects like process variation and resistive faults that are prevalent at 20-nm processes and below.