DFTMAX™ compression is a comprehensive test compression solution that addresses the cost challenges of testing complex designs, particularly when fabricated with small process technologies. These deep-submicron (DSM) designs can have subtle manufacturing defects that are only detected by applying DSM tests, such as at-speed and bridging tests, in addition to stuck-at tests. The extra patterns needed to achieve high test quality for these designs can increase both the test time and the test data, resulting in higher test costs. DFTMAX compression reduces these costs by delivering push-button 10-170x test data and test time compression with very low silicon area overhead. Seamlessly enabling compression in TetraMAX® ATPG, and encapsulated in Synopsys’ Galaxy™ Design Platform, DFTMAX compression achieves predictable results with virtually zero impact on timing.